MOBICON-REMOTE ELECTRONIC SDN BHD
19, Jalan PJS 3/59,
Taman Sri Manja,
46000 Petaling Jaya,
Selangor, Malaysia.
+603-7783 2257
+603-7783 4316

HIOKI FA1240-6x FLYING PROBE TESTER

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HIOKI FA1240-6x FLYING PROBE TESTER Automatic Test Equipment Hioki
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Overview

Flying Probe In-circuit Tester

DESCRIPTION

Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1240 series is a 4-arm populated board inspection tool that delivers multi-functional testing in as fast as 0.025 sec./step.
 

Key Features

• Quickly complete programs that take into account component height
• Automatically calculate arm interference (when used with the UA1780)
• Designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
• High-speed testing at up to 0.025 sec./step
• Detect IC lead float and pseudo-contact states
• Support for active testing (optional feature)
• High-precision probing
• Large testing area of 510 × 460 mm (FA1240-61)
• Standard transport capability
• Automatic alignment function and simple visual test function

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