MOBICON-REMOTE ELECTRONIC SDN BHD
19, Jalan PJS 3/59,
Taman Sri Manja,
46000 Petaling Jaya,
Selangor, Malaysia.
+603-7783 2257
+603-7783 4316

KEYSIGHT E9901E 1-module In-Circuit Test (ICT) System, i327x Series 5

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KEYSIGHT E9901E 1-module In-Circuit Test (ICT) System, i327x Series 5 In-circuit Test Keysight
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Product Details

The E9901E offers max 1296 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput


  • Max node count : 1296
  • Max channel count : 288
  • Max no of modules : 1
  • Standard Footprint : 1.3 m x 0.8 m / 4.2’ x 2.6’
  • E9901EL ‘Lean’ version footprint: 1.0 m x 0.8 m / 3.2’ x 2.6’ (25% footprint reduction)

The E9901E i307x Series 5 offers just enough nodes for testing small boards in a small footprint tester. The system includes the same Ease of use GUI on its predecessor, the E9901D i307x system. Since the launch of the first Series 1 3070 test system, decades ago, the Transportability, Reliability and Stability (TRS) is maintained including the capability to test at low voltages that are required with today’s components.

All i3070 Series 5 tests systems include a new infrastructure for more flexibility in the addition, control and connection of external electronics or instruments. The system allows external electronics to be plugged into the testhead as if it has been merged into the system. The external electronics can be functional test circuits to provide additional functional test coverage at ICT, or provide additional stimulus to the unit under test for better test coverage. Control of the external electronics, test sequence and test results are still through the BT-BASIC testplan, executed by the testhead PC Controller that our users are familiar with.

PCBAs today have higher current requirements in order to power their increased functionalities. It is now possible to pump 10 A into the unit under test through the tester. The power supply port can also be multiplexed so that one power supply can power up to 6 different boards in a panel. Each power channel is controlled by a relay so that the unit under test is protected.

The i3070 Series 5 test system includes a new Analog Stimulus and Measurement Unit (ASRU) that can boost the analog test speeds by 20%, thus increasing the throughput of the units under test.

The limited test access test tools found in previous revision of the test system is available here.

If you have small boards that you want to test quicker with better test coverage in a constrained area, the E9901E i307x Series 5 system is for you.

Read more about the i3070 Series 5 here.

Features Analog Plus
(Mux)
Access Plus
(Mux)
Hybrid Plus
(Mux)
Hybrid 144
(Unmux)
Test nodes per card 144 8 x High Frequency10:28 instrument ports24 x GP Relays  144 144
Digital channels per card N/A  N/A  16 144
Max pattern rate/frequency N/A  HF: 100MHz
Inst Ports: 25MHz
GP Relays: N/A
6/12/20 MPS 6 MPS
Maximum cards per module/system**  9/9 9/9 9/9 9/9
Analog voltage range 0-100V 0-100V 0-100V 0-100V
Digital Drive/Receive range N/A  N/A  -3.5 to 5.0V  0 to 4.75V
Edge Placement Accuracy N/A N/A +/- 10 nS +/- 10 nS

** Total pin cards cannot exceed 9 pin cards/module

To learn more, request additional product information.

For more information about ict systems, please visit ICT System - i3070.

 

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